First of all, have a look at
Stuck-at-Fault[
^] to get an understanding on what this exactly mean.
Then follow up with
Design-For-Test (DFT)[
^], which is an approach to get this fault model under control. Finally, get an understanding on
Automatic-Test-Pattern-Generation (ATPG)[
^] for the above mentioned DFT approach. See the
D-Algorithm[
^] for a possible pattern generation algorithm.
Cheers
Andi